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首页> 外文会议>Conference on Subsurface and Surface Sensing Technologies and Applications Ⅲ Jul 30-Aug 1, 2001, San Diego, USA >High Resolution 3D Image Reconstruction Based on Multistatic UWB Phase Processing
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High Resolution 3D Image Reconstruction Based on Multistatic UWB Phase Processing

机译：基于多静态UWB相位处理的高分辨率3D图像重建

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摘要

This paper presents the first results on multistatic ultra wideband (UWB) ground penetrating radar (GPR) interferometry. It has been known that phase data may contain subtle information of the physical and geometrical properties. Most GPR antennas are used in near-field and/or Fresnel regions; the energy scattered from randomly rough surfaces appears diffusely and merely depends on the wavelength of the incident radiation and the incident angles. The random nature makes it a difficult task to determine the profile of the surfaces. Furthermore it is too time-consuming to solve this kind of three-dimensional inhomogeneous problems by using pure electromagnetic approaches, especially when real time applications are required. Therefore we initiated the research on near-field UWB GPR interferometry to profile randomly inhomogeneous rough surfaces as well as their shallow layers in three-dimensional space. In this paper we discuss the first results based on practically measured multistatic UWB phase data scattered from curved objects. An initial algorithm that was developed for image reconstruction in the surface height domain (SHD) has been applied to the measured data. The image patterns show good agreement with the geometries of the practical curved objects. The results demonstrate the applicability of the phase information to characterization of the curved objects.
机译：本文介绍了多静态超宽带（UWB）探地雷达（GPR）干涉测量的第一个结果。已知相位数据可能包含有关物理和几何特性的细微信息。大多数GPR天线用于近场和/或菲涅耳区域；从随机粗糙表面散射的能量散布出现，并且仅取决于入射辐射的波长和入射角。随机性使确定表面轮廓变得困难。此外，通过使用纯电磁方法来解决这类三维不均匀问题非常耗时，尤其是在需要实时应用的情况下。因此，我们开始了对近场UWB GPR干涉测量的研究，以在三维空间中对随机不均匀的粗糙表面及其浅层进行剖析。在本文中，我们讨论了基于从弯曲物体散布的实际测量的多静态UWB相位数据的第一个结果。为在表面高度域（SHD）中进行图像重建而开发的初始算法已应用于测量数据。图像图案与实际弯曲物体的几何形状显示出很好的一致性。结果证明了相位信息在弯曲物体表征中的适用性。

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