• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>Conference on Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII Apr 21-22, 2003 Orlando, Florida, USA >Real-time IR/EO Scene Simulator (RISS) product improvements
【24h】

Real-time IR/EO Scene Simulator (RISS) product improvements

机译：实时IR / EO场景模拟器（RISS）产品改进

获取原文
获取原文并翻译 | 示例
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Northrop Grumman Amherst Systems has continued to improve the Real-time IR/EO Scene Simulator (RISS) for hardware-in-the-loop (HWIL) testing of infrared sensor systems. Several new and enhanced capabilities have been added to the system for both customer and internal development programs. A new external control capability provides control of either player trajectories or unit-under-test (UUT) orientation. The RISS Scene Rendering Subsystem (SRS) has been enhanced with support for texture transparency and increased texture memory capacity. The RISS Universal Programmable Interface (UPI) graphical user interface (GUI) has been improved to provide added flexibility and control of the real-time sensor modeling capabilities. This paper will further explore these and other product improvements.
机译：诺斯罗普·格鲁曼公司的Amherst Systems继续改进了实时IR / EO场景模拟器（RISS），用于红外传感器系统的硬件在环（HWIL）测试。系统为客户和内部开发程序添加了一些新的增强功能。新的外部控制功能可控制玩家的轨迹或被测单元（UUT）方向。 RISS场景渲染子系统（SRS）已得到增强，支持纹理透明性并增加了纹理存储容量。 RISS通用可编程接口（UPI）图形用户界面（GUI）已得到改进，以提供更多的灵活性和对实时传感器建模功能的控制。本文将进一步探讨这些和其他产品改进。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号