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Design of a MEMS force sensor for quantitative measurement in the nano- to piconewton range

机译:MEMS力传感器的设计,可在纳米到皮克顿范围内进行定量测量

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摘要

We describe the design and fabrication of a MEMS based force sensor with SI traceability for measurement ofrnforces from a few nN down to 200 pN. The sensor is based on the same principles of operation as the larger-scalernElectrostatic Force Balance at NIST. It consists of a silicon rigid arm supported on tethers, two sets of capacitivernelectrodes for electrostatic actuation and capacitance gradient sensing, and a fiber optic Fabry-Perot cavityrninterferometer with a demonstrated displacement resolution of 2 picometers. We describe the design of the sensor’srnkinematic stage and its theoretical performance metrics.
机译:我们描述了具有SI可追溯性的,基于MEMS的力传感器的设计和制造,可用于测量从几nN到200 pN的力。该传感器的工作原理与NIST上的大型静电力平衡器相同。它由支撑在绳索上的硅质刚性臂,两组用于静电驱动和电容梯度传感的电容电极以及一台光纤法布里-珀罗腔干涉仪(已证明位移分辨率为2皮米)组成。我们描述了传感器运动学阶段的设计及其理论性能指标。

著录项

  • 来源
    《Device packaging 2010》|2010年|p.1-6|共6页
  • 会议地点 Scottsdale/Fountain Hills AZ(US)
  • 作者单位

    Materials Reliability Division, National Institute of Standards and Technology, Boulder, CO University of Colorado at Boulder, Dept. of Mechanical Engineering, Boulder, CO;

    Electromagnetics Division, National Institute of Standards and Technology, Boulder, CO;

    Manufacturing Metrology Division, National Institute of Standards and Technology, Gaithersburg, MD;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 制造工艺;
  • 关键词

    MEMS; force sensor; SI traceable; nN;

    机译:MEMS ;;力传感器; SI可追溯; nN;

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