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A Novel SWIR Detector with an Ultra-high Internal Gain and Negligible Excess Noise

机译:具有超高内部增益和可忽略的过量噪声的新型SWIR检测器

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摘要

Short wave infrared (SWIR) imaging systems have several advantages due to the spectral content of the nightglow and better discrimination against camouflage. Achieving single photon detection sensitivity can significantly improve the image quality of these systems. However, the internal noise of the detector and readout circuits are significant barriers to achieve this goal. One can prove that the noise limitations of the readout can be alleviated, if the detector exhibits sufficiently high internal gain. Unfortunately, the existing detectors with internal gain have a very high noise as well. Here we present the recent results from our novel FOcalized Carrier augmented Sensor (FOCUS). It utilizes very high charge compression into a nano-injector, and subsequent carrier injection to achieve high quantum efficiency and high sensitivity at short infrared at room temperature. We obtain internal gain values exceeding several thousand at bias values of less than 1 volt. The current responsivity at 1.55 μm is more than 1500 A/W, and the noise equivalent power (NEP) is less that 0.5 ×10~(-15) W/Hz~(1/2) at room temperature. These are significantly better than the performance of the existing room temperature devices with internal gain. Also, unlike avalanche-based photodiodes, the measured excess noise factor for our device is near unity, even at very high gain values. The stable gain of the device combined with the low operating voltage are unique advantages of this technology for high-performance SWIR imaging arrays.
机译:短波红外(SWIR)成像系统由于夜光的光谱含量和对伪装的更好区分而具有多个优势。实现单光子检测灵敏度可以显着改善这些系统的图像质量。然而,检测器和读出电路的内部噪声是实现该目标的重要障碍。可以证明,如果检测器具有足够高的内部增益,则可以减轻读数的噪声限制。不幸的是,现有的具有内部增益的检测器也具有很高的噪声。在这里,我们介绍了我们的新型FOcalized载波增强传感器(FOCUS)的最新结果。它利用非常高的电荷压缩率注入纳米注入器,然后进行载流子注入,从而在室温下短红外下实现了高量子效率和高灵敏度。在小于1伏的偏置值下,我们获得了超过数千的内部增益值。在室温下,1.55μm时的电流响应大于1500 A / W,噪声等效功率(NEP)小于0.5×10〜(-15)W / Hz〜(1/2)。这些明显优于具有内部增益的现有室温设备的性能。此外,与基于雪崩的光电二极管不同,即使在非常高的增益值下,我们设备的实测多余噪声因子也接近于1。器件的稳定增益和低工作电压是该技术对高性能SWIR成像阵列的独特优势。

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