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首页> 外文会议>2019 ESA Workshop on Aerospace EMC >Prediction of Electronic Unit Radiated Emissions from Both PCB Near Field and Shielding Enclosure Characterization
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Prediction of Electronic Unit Radiated Emissions from Both PCB Near Field and Shielding Enclosure Characterization

机译：PCB近场和屏蔽罩特性对电子单元辐射的预测

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This paper presents the post-processing methodology devoted to the Near-Field-Scanning (NFS) to provide assistance in ElectroMagnetic Compatibility (EMC) design phases of complex electronics products. A major challenge for spacecraft manufacturers for incoming year concerns the control of units Radiated Emissions (RE). Indeed, high speed links could induce RE non-compliance for units in on-board receiver frequencies (ex: GPS, TCR...). To avoid additional test campaign or system level analyses, Near Field techniques could be a powerful way to anticipate RE non-conformities in unit design phase. Based both on NFS (only Hx and Hy magnetic components very closed to the Printed Circuit Board (PCB)), and on Shielding enclosure Effectiveness (SE) characterization, the proposed “NFS2RE” (Near Field Scanning to Radiated Emission Test) methodology allows: 1)RE-Test prediction of PCB in free space condition from only Hx and Hy NFS 2)Prediction of Shielding PCB's enclosure attenuation on RE-Test from SE characterization.
机译：本文介绍了专用于近场扫描（NFS）的后处理方法，以在复杂电子产品的电磁兼容性（EMC）设计阶段提供帮助。来年航天器制造商面临的主要挑战涉及对辐射单元（RE）的控制。的确，高速链路可能会导致车载接收器频率（例如GPS，TCR ...）中的RE违规。为了避免进行额外的测试活动或系统级分析，近场技术可能是在单元设计阶段预测RE不合格的一种有效方法。两者均基于NFS（仅H \ n x \ n和H \ n y\n磁性元​​件非常靠近印刷电路板（PCB）），并在屏蔽罩的有效性（SE）表征中，建议使用“ NFS \ n 2 < / sub> \ nRE”（近场扫描到辐射发射测试）方法可以：1）仅在H \ n x \ n和H \ n y \ n NFS 2）根据SE表征，通过RE-Tes​​t预测屏蔽PCB的外壳衰减。

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