Abstract: Developments in high resolution double delay line (DDL) and cross delay line image readouts for applications in UV and soft X-ray imaging and spectroscopy are described. Our current DDL's achieve $APEQ 15 $mu@m $MUL 25 $mu@m FWHM over 65 $MUL 15 mm ($GRT 4000 $MUL 500 resolution elements) with counting rates of $GRT 10$+5$/ (10% dead time), good linearity ($POM $APEQ 1 resolution element) and high stability. We have also developed 65 mm $MUL 15 mm multilayer cross delay line anodes with external serpentine delay lines which currently give $APEQ 20 $mu@m FWHM resolution in both axes, with good linearity ($APEQ 30 $mu@m) and flat field performance. State of the art analog to digital converter and digital signal processor technology have been employed to develop novel event position encoding electronics with high count rate capability (2 $MUL 10$+5$/ events sec$+$MIN@1$/).!14
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机译：摘要：描述了高分辨率双延迟线（DDL）和交叉延迟线图像读数在紫外和软X射线成像以及光谱学中的应用发展。我们当前的DDL达到$ APEQ 15 $ mu @ m $ MUL 25 $ mu @ m FWHM超过65 $ MUL 15 mm（$ GRT 4000 $ MUL 500分辨率元素），计数率为$ GRT 10 $ + 5 $ /（10％停滞时间），良好的线性度（$ POM $ APEQ 1分辨率元素）和高稳定性。我们还开发了带有外部蛇形延迟线的65 mm $ MUL 15 mm多层交叉延迟线阳极，该阳极目前在两个轴上均提供$ APEQ 20 $ mu @ m FWHM分辨率，并具有良好的线性度（$ APEQ 30 $ mu @ m）和平坦的现场表现。先进的模数转换器和数字信号处理器技术已被用于开发具有高计数率功能（2 $ MUL 10 $ + 5 $ / events sec $ + $ MIN @ 1 $ /）的新颖事件位置编码电子设备。 ！14
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