Developments in high resolution double delay line (DDL) and cross delay line image readouts for applications in UV and soft X-ray imaging and spectroscopy are described. Our current DDL's achieve $APEQ 15 $mu@m $MUL 25 $mu@m FWHM over 65 $MUL 15 mm ($GRT 4000 $MUL 500 resolution elements) with counting rates of $GRT 10$+5$/ (10% dead time), good linearity ($POM $APEQ 1 resolution element) and high stability. We have also developed 65 mm $MUL 15 mm multilayer cross delay line anodes with external serpentine delay lines which currently give $APEQ 20 $mu@m FWHM resolution in both axes, with good linearity ($APEQ 30 $mu@m) and flat field performance. State of the art analog to digital converter and digital signal processor technology have been employed to develop novel event position encoding electronics with high count rate capability (2 $MUL 10$+5$/ events sec$+$MIN@1$/).
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机译：描述了在UV和软X射线成像和光谱中的高分辨率双延迟线（DDL）和交叉延迟线图像读数的开发。我们目前的DDL's达到$ APEQ 15 $ MU @ MUR MUL 25 $ MU @ M FWWHM超过65美元15毫米（$ 4000 $ MUL 500分辨率元素），计数$ 10 $ + 5 $ /（10％死亡时间），良好的线性度（$ Pom $ APEQ 1分辨率元素）和高稳定性。我们还开发了65毫米$ MUL的多层交叉延迟线阳极，外部蛇形延迟线，目前在两个轴上提供$ APEQ 20 $ MU @ M FWHM分辨率，具有良好的线性度（$ APEQ 30 $ MU @ M）和平坦现场性能。最先进的数字转换器和数字信号处理器技术已经采用了开发了具有高计数率能力的新型事件位置（2 $ MUL 10 $ + 5 $ /事件SEC $ + $ MIN @ 1 $）。
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