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Assessing the Significance of Electro-Thermal Stress on Varistor Arresters Using Kruskal-Wallis H-Test

机译:使用Kruskal-Wallis H检验评估压敏电阻电热应力的重要性

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In this study, the effect of electro-thermal stresses on the microstructure of low-voltage zinc oxide varistors is experimentally investigated. Accelerated ageing tests, based on continuous ac voltage stress at several thermal points, are conducted prior to linear intercept on scanning electro microscopy-based micrographs. The Kruskal-Wallis H-test is used to assess the extent of microstructural changes in the tested varistor arresters. Results obtained show significant change in the microstructure of the varistor arresters as a result of electro-thermal treatment.
机译:在这项研究中,实验研究了电热应力对低压氧化锌压敏电阻微结构的影响。在基于扫描电镜的显微照片上进行线性截距之前,基于在多个温度点上的连续交流电压应力进行了加速老化测试。 Kruskal-Wallis H检验用于评估所测试的压敏电阻避雷器的微观结构变化程度。获得的结果表明,由于电热处理,压敏电阻避雷器的微观结构发生了显着变化。

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