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首页> 外文会议>Infrared systems and photoelectronic technology IV >DESIGN AND DEVELOPMENT OF NANOSTRUCTURE BASED ANTIREFLECTION COATINGS FOR EO/IR SENSOR APPLICATIONS
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DESIGN AND DEVELOPMENT OF NANOSTRUCTURE BASED ANTIREFLECTION COATINGS FOR EO/IR SENSOR APPLICATIONS

机译：基于纳米结构的EO / IR传感器防反射涂层的设计与开发

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摘要

EO/IR nanosensors are being developed for a variety of Defense and Commercial Systems Applications. These include UV, Visible, NIR, MWIR and LWIR nanotechnology based Sensors. The conventional SWIR Sensors use InGaAs based IR Focal Plane Array (FPA) that operate in 1.0-1.8 micron region. Similarly, MWIR Sensors use InSb or HgCdTe based FPA that is sensitive in 3-5 micron region. More recently, there is effort underway to evaluate low cost SiGe visible and near infrared band that covers performance up to 1.6 micron.rnThe use of nanowires for developing high quality antireflection coatings that allows minimizing the reflection loss is discussed. We have explored the possibility of using nanostructures grown by oblique angle deposition technique. A graded-index coating with different index profiles has been investigated for broadband antireflection properties, particularly with air as the ambient medium. In this paper, we present, modeling and experimental results for nanostructure AR coatings for UV, Visible and calculations for NIR sensors and also their utility for longer wavelength application.
机译：EO / IR纳米传感器正在为各种国防和商业系统应用开发。其中包括基于UV，可见光，NIR，MWIR和LWIR纳米技术的传感器。传统的SWIR传感器使用基于InGaAs的IR焦平面阵列（FPA），该阵列在1.0-1.8微米范围内运行。同样，MWIR传感器使用基于InSb或HgCdTe的FPA，在3-5微米区域内敏感。最近，人们正在努力评估覆盖高达1.6微米性能的低成本SiGe可见光和近红外波段。讨论了使用纳米线开发高质量的减反射涂层，从而使反射损失最小。我们已经探索了使用通过倾斜角沉积技术生长的纳米结构的可能性。已经研究了具有不同折射率分布的渐变折射率涂层的宽带抗反射性能，尤其是在空气作为环境介质的情况下。在本文中，我们介绍了用于紫外线，可见光的纳米结构增透膜的建模和实验结果，以及用于近红外传感器的计算以及它们在较长波长应用中的效用。

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  • 来源
    《Infrared systems and photoelectronic technology IV》|2009年|P.74190U.1-74190U.8|共8页
  • 会议地点 San Diego CA(US)
  • 作者

    Ashok K. Sood; Roger E. Welser; Yash R. Puri; Martin F. Schubert; David J Poxson; Jong Kyu Kim; E. Fred Schubert; Dennis L. Polla; Martin B. Soprano;

  • 作者单位

    Magnolia Optical Technologies, Inc. 52-B Cummings Park, Woburn, MA 01801;

    rnMagnolia Optical Technologies, Inc. 52-B Cummings Park, Woburn, MA 01801;

    rnMagnolia Optical Technologies, Inc. 52-B Cummings Park, Woburn, MA 01801;

    rnDepartment of ECSE and Physics, Rensselaer Polytechnic Institute, Troy, NY 12180;

    rnDepartment of ECSE and Physics, Rensselaer Polytechnic Institute, Troy, NY 12180;

    rnDepartment of ECSE and Physics, Rensselaer Polytechnic Institute, Troy, NY 12180;

    rnDepartment of ECSE and Physics, Rensselaer Polytechnic Institute, Troy, NY 12180;

    rnDARPA/MTO, 3701 North Fairfax Drive, Arlington, VA 22203;

    rnUS Army, AMSRD-AMR-WS-DP-SB, Redstone Arsenal, AL 35898;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 红外技术及仪器;
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