首页> 外文会议>Institute of Physics Electron Microscopy and Analysis Group Conference, Sep 5-7, 2001, Dundee >Towards scanned neutral particle microscopy: Developing neutral particle analogues of charged particle lenses
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Towards scanned neutral particle microscopy: Developing neutral particle analogues of charged particle lenses

机译:迈向扫描中性粒子显微镜:开发带电粒子透镜的中性粒子类似物

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Scanning microscopes employing neutral particle probes can offer advantages over charged-particle microscopes for some measurements and may also enable entirely new spectroscopic tools. The required focusing neutral-particle optics are however far less developed than the electron optics of scanning electron microscopes (SEM). Here we present calculations for a proposed neutral-particle "magnetostatic aperture lens" as an example of how it is possible to quite generally adapt the cylindrically symmetric charged-particle optics such as those used in SEM, to neutral particles including neutrons and neutral atoms and molecules for use in possible scanned neutral-particle microscopes.
机译:使用中性粒子探针的扫描显微镜在某些测量方面可以提供优于带电粒子显微镜的优势,并且还可以使用全新的光谱工具。但是,所需的聚焦中性粒子光学器件远没有扫描电子显微镜(SEM)的电子光学器件发达。在这里,我们以提出的中性粒子“静磁场光阑透镜”为例进行计算,作为一个例子,说明如何大致上将圆柱对称的带电粒子光学器件(如SEM中使用的)适应于包括中子和中性原子的中性粒子,以及用于可能的扫描中性粒子显微镜的分子。

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