• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>International Conference on Advances in Destructive and Non-Destructive Analysis for Environmental Monitoring and Nuclear Forensics; 20021021-20021023; Karlsruhe; DE >FROM THE SEM (IAEA) TO THE SIMS (ITU): RELOCATION EXPERIMENT OF MICROMETRE SIZED PARTICLES - INITIAL RESULTS
【24h】

FROM THE SEM (IAEA) TO THE SIMS (ITU): RELOCATION EXPERIMENT OF MICROMETRE SIZED PARTICLES - INITIAL RESULTS

机译：从SEM（IAEA）到SIMS（ITU）：微米尺寸颗粒的重新分配实验-初步结果

获取原文
获取原文并翻译 | 示例
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Multiple analyses, elemental and isotopic, of individual radioactive particles in the urn range are key tools in environmental research and in nuclear forensics. They require the ability to precisely locate particles of interest (POIs) in the secondary ion mass spectrometer (SIMS), or other instrument, after they have been identified in scanning electron microscopy (SEM). A triangulation location method, based on microscopic reference marks imprinted on the sample holder, has been developed and successfully implemented in the IAEA (Seibersdorf) Clean Laboratory at Seibersdorf. We describe a feasibility round-robin-type test, performed jointly by the IAEA and the Institute for Transuranium Elements (ITU). A sample loaded with uranium oxide particles was prepared at the ITU and sent to the IAEA, where 25 POIs were selected after being identified in an automated particle search. Then, the sample was returned to the ITU, where the same particles were located and analysed, both in the SEM and in the SIMS. The location precision was better than 10 μm in the SEM and 20 μm in the SIMS over the whole sample area, 2 cm in diameter. The experiment proved that the method facilitates repeated analyses of individual um sized particles in different instruments.
机译：范围内单个放射性粒子的元素和同位素的多种分析是环境研究和核法证学的关键工具。在扫描电子显微镜（SEM）中被识别后，它们需要具有在次级离子质谱仪（SIMS）或其他仪器中精确定位目标颗粒（POI）的能力。已经开发了一种基于刻在样品架上的微观参考标记的三角定位方法，并已在塞伯斯多夫的IAEA（塞伯斯多夫）清洁实验室中成功实施。我们描述了由国际原子能机构和国际铀元素研究所（ITU）联合进行的可行性循环试验。在国际电联准备了一个载有氧化铀颗粒的样品，并送交了国际原子能机构，该机构在自动颗粒搜索中确定了25个POI。然后，将样品送回ITU，在SEM和SIMS中对相同的颗粒进行定位和分析。在整个直径为2 cm的样品区域中，SEM的定位精度优于10μm，SIMS的定位精度优于20μm。实验证明，该方法有助于在不同仪器中重复分析单个微米大小的颗粒。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号