Three-beam X-ray diffraction in crystals with thin strain layers

机译：薄应变层晶体中的三束X射线衍射

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摘要

By a numerical solution of the system of Takagi differential equations, the influence of a thin subsurface strained layer and a system of equal strained layers on three-beam diffraction effects of X-ray scattering in A~3B~5 compounds and diamond crystals has been investigated. It is established that the degree of suppression or enhancement of three-beam anomalous transmission significantly depends on the influence of the parameters of the strained layer on various effects typical for each multiple configuration, as well as on the structural features of the crystals being considered.

机译：通过Takagi微分方程组的数值解，已经发现了薄的地下应变层和等应变层系统对A〜3B〜5化合物和金刚石晶体中X射线散射的三束衍射效应的影响。调查。可以确定的是，三束异常传输的抑制或增强程度很大程度上取决于应变层参数对每种多重配置所特有的各种效应的影响，以及所考虑晶体的结构特征。

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来源
《International Conference on Correlation Optics; 20030916-20030919; Chernivtsi; UA》|2003年|P.206-214|共9页
会议地点 Chernivtsi(UA)
作者
Borcha M.D.; Kshevetsky O.S.; Tkach V.M.;
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作者单位

Chernivtsi national university, Kotsubynskogo str., 2, Chernivtsi, 58012, Ukraine;

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原文格式 PDF
正文语种 eng
中图分类应用光学;
关键词
three-beam X-ray diffraction; A~3B~5 compounds; diamond; strain; simulation; takagi equations;

机译：三束X射线衍射; A〜3B〜5化合物;金刚石;应变;模拟;高木方程;

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专利

1. X-ray topography of perfect crystals using the Laue-Laue three-beam case of diffraction [J] . Heyroth F., Hoche HR., Eisenschmidt C. Crystal Research and Technology: Journal of Experimental and Industrial Crystallography . 1998,第4期

机译：使用Laue-Laue三束衍射情况的完美晶体的X射线形貌
2. Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films [J] . Dudley M, Bai J, Huang X, Materials science in semiconductor processing . 2006,第1a3期

机译：同步带隙白光X射线形貌，透射电子显微镜和高分辨率X射线衍射研究宽带隙半导体晶体和薄膜中的缺陷和应变松弛过程
3. Studying defect structure of GaN epilayers by means of three-beam X-ray diffraction analysis [J] . Kyutt R.N. Technical physics letters: Letters to the Russian journal of applied physics . 2010,第8期

机译：三束X射线衍射分析研究GaN外延层的缺陷结构
4. Three-beam X-ray diffraction in crystals with thin strain layers [C] . Borcha M.D., Kshevetsky O.S., Tkach V.M., International Conference on Correlation Optics . 2004

机译：具有薄菌株层的三梁X射线衍射
5. X-ray microbeam diffraction study of strain in polycrystalline aluminum thin films. [D] . Moyer, Laura E. 2005

机译：多晶铝薄膜中应变的X射线微束衍射研究。
6. Delayed crystallization of ultrathin Gd2O3 layers on Si(111) observed by in situ X-ray diffraction [O] . Michael Hanke, Vladimir M Kaganer, Oliver Bierwagen, 2012

机译：原位X射线衍射观察到Si（111）上Gd2O3超薄层的延迟结晶
7. Quantitative determination of phases of X-ray reflection from three-beam diffraction. III. Experiments on mosaic crystals [O] . S.-L. Chang 2010

机译：定量测定三束衍射产生的X射线反射相。三，镶嵌晶体的实验

Three-beam X-ray diffraction in crystals with thin strain layers

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