首页> 外文会议>International Conference on Nitride Semiconductors(ICNS-5); 20030525-20030530; Nara; JP >Sub-microscopic transient lens spectroscopy of InGaN/GaN quantum wells
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Sub-microscopic transient lens spectroscopy of InGaN/GaN quantum wells

机译:InGaN / GaN量子阱的亚显微瞬态透镜光谱

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摘要

Transient lens (TL) spectroscopy was developed with sub-micrometer spatial resolution to observe the temporal and special behavior of the nonradiative processes of carrier dynamics in InGaN/GaN quantum wells (QW). We have observed the carrier density dynamics and the thermal dynamics in the TL signals with a nanosecond pulsed laser. We have also observed TL and photoluminescence (PL) signals by using near-field scanning optical microscopy (NSOM), and find that both PL and TL images are correlated and exhibit submicron scale spatial inhomogeneity.
机译:开发了具有亚微米空间分辨率的瞬态透镜(TL)光谱仪,以观察InGaN / GaN量子阱(QW)中载流子动力学非辐射过程的时间和特殊行为。我们已经观察到了纳秒脉冲激光在TL信号中的载流子密度动态和热动态。我们还通过使用近场扫描光学显微镜(NSOM)观察了TL和光致发光(PL)信号,发现PL和TL图像都相关并且显示出亚微米级的空间不均匀性。

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