首页> 外文会议>International Conference on Nitride Semiconductors(ICNS-5); 20030525-20030530; Nara; JP >Coexistence in photoluminescence of free exciton and bound exciton in low nitrogen content GaInNAs layers
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Coexistence in photoluminescence of free exciton and bound exciton in low nitrogen content GaInNAs layers

机译:氮含量低的GaInNAs层中自由激子和结合激子的光致发光共存

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摘要

We study by time resolved photoluminescence (TRPL) low N and In content GaInNAs (GINA) alloy layers grown by molecular beam epitaxy on GaAs substrate. The TRPL experiments show the coexistence and the carrier exchanges between bound- and free-exciton states, in this kind of alloy. Temperature dependent experiments demonstrate the thermal ionization of bound excitons and the high temperature stability of free excitons. For a temperature higher than 60 K the PL spectra are totally dominated by the free exciton line.
机译:我们通过在GaAs衬底上通过分子束外延生长的时间分辨光致发光(TRPL)低N和In含量GaInNAs(GINA)合金层进行研究。 TRPL实验表明,在这种合金中,束缚态和自由激发态之间共存和载流子交换。温度依赖性实验证明了结合的激子的热电离和游离激子的高温稳定性。对于高于60 K的温度,PL光谱完全由自由激子线控制。

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