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首页> 外文会议>International Conference on Surface and Colloid Science; 200309; Brazil >The characterization of nanocrystalline V_2O_5 and mixed V_2O_5/Ce oxide
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The characterization of nanocrystalline V_2O_5 and mixed V_2O_5/Ce oxide

机译：纳米晶V_2O_5和混合V_2O_5 / Ce氧化物的表征

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摘要

Thin films of vanadium oxide and new, mixed V/Ce oxide thin films with 55 and 38 atom % of V were prepared on glass substrates covered with SnO_2:F (K-glass) The influence of the added cerium precursors as well as the influence of the substrate material on the formation of the films were studied in order to connect their improved intercalation properties for Li ions. The structural properties and the morphologies of the films were determined with transmission electron microscopy and grazing-incidence small-angle X-ray scattering. Transmission electron microscopy revealed the crystalline structure, with the formation of V_2O_5 (orthorhombic structure) in all the films. The average grain radius, obtained by grazing-incidence small-angle X-ray scattering was correlated with the layer thickness.
机译：在覆盖有SnO_2：F的玻璃基板（K玻璃）上制备了钒氧化物薄膜和V原子百分比分别为55和38的新型V / Ce混合氧化物薄膜。添加铈前体的影响以及影响研究了基底材料对薄膜形成的影响，以便将其改善的锂离子嵌入性能联系起来。用透射电子显微镜和掠入射小角X射线散射法测定薄膜的结构性能和形貌。透射电子显微镜显示晶体结构，在所有膜中形成V_2O_5（斜方晶结构）。通过掠入射小角X射线散射获得的平均晶粒半径与层厚度相关。

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