CMM PROBE TESTING BY MEANS OF A LOW FORCE SENSOR

机译：通过低压力传感器进行CMM探针测试

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The method and the computerised set-up for the accuracy of touch trigger probe testing, outside CMM is discussed. A high resolution interference displacement transducer with a low measuring force is applied. The results of preliminary tests of TP2-5W and TP6 (Renishaw) probe in XYZ space are shown. The metrological characteristics of the probe are analysed.

机译：讨论了在CMM之外用于触发式测头测试的准确性的方法和计算机设置。使用具有低测量力的高分辨率干涉位移传感器。显示了TP2-5W和TP6（雷尼绍）探头在XYZ空间中的初步测试结果。分析了探针的计量特性。

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来源
《International Measurement Confederation XVI IMEKO World Congress (IMEKO 2000) Vol.8, Sep 25-28, 2000, Vienna, Austria》|2000年|p.341-344|共4页
会议地点 Vienna(AT);Vienna(AT)
作者
A. Wozniak; M. Dobosz;
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作者单位

Institute of Metrology and Measuring Systems, Warsaw University of Technology Chodkiewicza 8 St. 02-525 Warsaw, Poland;

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会议组织
原文格式 PDF
正文语种 eng
中图分类一般工业技术;
关键词
coordinate measuring machines; touch trigger probe;

机译：坐标测量机；触发式测头;

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1. Setup for Triggering Force Testing of Touch Probes for CNC Machine Tools and CMMs [J] . A. Wozniak, M. Byszewski, M. Jankowski Mineralogia . 2013,第1期

机译：用于CNC机床和CMM的测头触发力测试的设置
2. Setup for Triggering Force Testing of Touch Probes for CNC Machine Tools and CMMs [J] . A. Wozniak, M. Byszewski, M. Jankowski Mineralogia . 2013,第1期

机译：用于CNC机床和CMM的测头触发力测试的设置
3. Development of a coordinate measuring machine (CMM) touch probe using a multi-axis force sensor [J] . Jae-jun Park, Kihwan Kwon, Nahmgyoo Cho Measurement Science & Technology . 2006,第9期

机译：使用多轴力传感器开发坐标测量机（CMM）测头
4. CMM PROBE TESTING BY MEANS OF A LOW FORCE SENSOR [C] . International Measurement Confederation world congress . 2000

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5. Developing and testing a novel low cost force and torque sensor suitable for robotic applications [D] . Sherman, Daniel 2015

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6. Probing cellular traction forces with magnetic nanowires and microfabricated force sensor arrays [O] . Yi-Chia Lin, Corinne M. Kramer, Christopher S. Chen, -1

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7. Setup for Triggering Force Testing of Touch Probes for CNC Machine Tools and CMMs [O] . A. Wozniak, M. Byszewski, M. Jankowski 2013

机译：设置用于CNC机床和CMMS的触发探测力测试的触发力测试

CMM PROBE TESTING BY MEANS OF A LOW FORCE SENSOR

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