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首页> 外文会议>Machine Vision Applications in Industrial Inspection XIV; Electronic Imaging Science and Technology >Twin and Scratch Detection and Removal in Micrograph Images of Inconel™718
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Twin and Scratch Detection and Removal in Micrograph Images of Inconel™718

机译：Inconel™718的显微图像中的孪生和划痕检测与去除

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摘要

Grain size of forged nickel alloy is an important feature for the mechanical properties of the material. For fully automatic grain size evaluation in images of micrographs it is necessary to detect the boundaries of each grain. This grain boundary detection is influenced directly by artifacts like scratches and twins. Twins can be seen as parallel lines inside one grain, whereas a scratch can be identified as a sequence of collinear line segments that can be spread over the whole image. Both kinds of artifacts introduce artificial boundaries inside grains. To avoid wrong grain size evaluation, it is necessary to remove these artifacts prior to the size evaluation process. For the generation of boundary images various algorithms have been tested. The most stable results were achieved by grayscale reconstruction and a subsequent watershed segmentation. A modified line Hough transform with a third dimension in the Hough accumulator space, describing the distance of the parallel lines, is used to directly detect twins. Scratch detection is done by applying the standard line Hough transform followed by a rule based segment detection along the found Hough lines. The results of these operations give a detection rate of more than 90 percent for twins and more than 50 percent for scratches.
机译：锻造镍合金的晶粒尺寸是该材料机械性能的重要特征。为了在显微图像中进行全自动晶粒度评估，必须检测每个晶粒的边界。这种晶界检测直接受到诸如划痕和孪晶之类的伪影的影响。双胞胎可以看作是一个晶粒内的平行线，而划痕可以识别为可以分布在整个图像上的一系列共线线段。两种人工制品都会在晶粒内部引入人工边界。为了避免错误的晶粒尺寸评估，有必要在尺寸评估过程之前去除这些瑕疵。为了生成边界图像，已经测试了各种算法。最稳定的结果是通过灰度重建和随后的分水岭分割获得的。在霍夫累加器空间中使用第三维的改进线霍夫变换，描述了平行线的距离，用于直接检测双胞胎。通过应用标准线霍夫变换，然后沿着找到的霍夫线进行基于规则的分段检测，可以完成划痕检测。这些操作的结果使双胞胎的检测率超过90％，划痕的检测率超过50％。

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