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首页> 外文会议>Conference on Machine Vision Applications in Industrial Inspection >Twin and Scratch Detection and Removal in Micrograph Images of Inconel#8482;718
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Twin and Scratch Detection and Removal in Micrograph Images of Inconel#8482;718

机译：Inconel™718的显微照片图像中的双绞线和划痕检测和移除

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摘要

Grain size of forged nickel alloy is an important feature for the mechanical properties of the material. For fully automatic grain size evaluation in images of micrographs it is necessary to detect the boundaries of each grain. This grain boundary detection is influenced directly by artifacts like scratches and twins. Twins can be seen as parallel lines inside one grain, whereas a scratch can be identified as a sequence of collinear line segments that can be spread over the whole image. Both kinds of artifacts introduce artificial boundaries inside grains. To avoid wrong grain size evaluation, it is necessary to remove these artifacts prior to the size evaluation process. For the generation of boundary images various algorithms have been tested. The most stable results were achieved by grayscale reconstruction and a subsequent watershed segmentation. A modified line Hough transform with a third dimension in the Hough accumulator space, describing the distance of the parallel lines, is used to directly detect twins. Scratch detection is done by applying the standard line Hough transform followed by a rule based segment detection along the found Hough lines. The results of these operations give a detection rate of more than 90 percent for twins and more than 50 percent for scratches.
机译：伪造镍合金的晶粒尺寸是材料机械性能的重要特征。为了在显微照片图像中进行全自动粒度评估，有必要检测每个谷物的边界。该晶界检测直接受割刮和双胞胎的伪像影响。双胞胎可以被视为一个颗粒内部的平行线，而划痕可以被识别为可以在整个图像上铺展的共线线段序列。两种工件在谷物中引入了人为边界。为了避免错误的晶粒尺寸评估，有必要在大小评估过程之前去除这些伪像。对于产生边界图像，已经测试了各种算法。通过灰度重建和随后的流域分割来实现最稳定的结果。使用Hough蓄能器空间中的第三尺寸的修改线霍夫变换，描述了平行线的距离，用于直接检测双胞胎。通过应用标准线Hough变换，然后沿着发现的Hough线路进行规则的段检测来完成划痕检测。这些操作的结果为双胞胎的检出率超过90％，超过50％的划痕。

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