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ZnO Field-effect Transistor Fabricated by RF Magnetron Suputtering and Lithographic/Wet Etching Processes

机译:射频磁控管吸塑和光刻/湿蚀刻工艺制造的ZnO场效应晶体管

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The fabrication of zinc oxide (ZnO)based thin-film field-effect transistors (TFTs) on p-Si substrates by rf magnetron sputtering, photolithography and wet etching processes was presented. Bottom-gate-type thin film transistors using ZnO as an active channel layer were constructed, and their properties were characterized by atomic force microscope, X-ray diffraction and I-V measurements. The fabricated ZnO transistors exhibited enhancement mode characteristics with the on-to-off current ratio of ~10~5 and the threshold voltage of 10V. It is believed that the ZnO TFTs fabricatd by the simple and low-cost technique could be applicable to electronic devices.
机译:提出了通过射频磁控溅射,光刻和湿法刻蚀工艺在p-Si衬底上制备基于氧化锌(ZnO)的薄膜场效应晶体管(TFT)的方法。构造了以ZnO为有源沟道层的底栅型薄膜晶体管,并通过原子力显微镜,X射线衍射和I-V测量来表征其特性。所制备的ZnO晶体管表现出增强模式特性,开关电流比为〜10〜5,阈值电压为10V。相信通过简单和低成本技术制造的ZnO TFT可以适用于电子设备。

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