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首页> 外文会议>Mechanical properties and performance of engineering ceramics and composites VII >VISUALIZATION OF INTERNAL DEFECTS IN CERAMIC PRODUCTS BY USING A UT PROBE ARRAY
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VISUALIZATION OF INTERNAL DEFECTS IN CERAMIC PRODUCTS BY USING A UT PROBE ARRAY

机译：使用UT探针阵列可视化陶瓷产品中的内部缺陷

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摘要

The possibility of inspecting defects in ceramic materials using a UT probe array was studied to investigate the reliability of ceramic products. Large structural components made of many small blocks are likely to include internal fatal defects, particularly in joints, and their fracture response is much faster and more drastic than that of metal materials. Therefore, non-destructive testing (NDT) is necessary to detect internal defects . A UT probe array can scan the inside of a sample and reconstruct images of internal defects. However, this process takes a long time. Braconnier and Hirose proposed methods to reconstruct an image of internal defects more quickly. In the present study, samples with inserted defects were prepared to simulate defects in ceramics, and data was acquired to reconstruct images. An array probe with a large aperture was also developed to inspect defects deep within large ceramics samples (longer than 100mm) and applied to a large ceramic sample and an aluminum sample. To evaluate visualization using the UT array probe, some configurations of delay time, noise reduction, and image reconstruction methods were tried, and their influences were examined in order to construct an NDT system for inspecting large ceramic products.
机译：研究了使用UT探头阵列检查陶瓷材料中缺陷的可能性，以研究陶瓷产品的可靠性。由许多小块组成的大型结构部件可能包括内部致命缺陷，尤其是在接头中，并且其断裂响应比金属材料的断裂响应要快得多，作用也更加剧烈。因此，必须使用无损检测（NDT）来检测内部缺陷。 UT探针阵列可以扫描样品的内部并重建内部缺陷的图像。但是，此过程需要很长时间。 Braconnier和Hirose提出了更快地重建内部缺陷图像的方法。在本研究中，准备了具有插入缺陷的样品以模拟陶瓷中的缺陷，并获取了数据以重建图像。还开发了一种具有大孔径的阵列探针，以检查大型陶瓷样品（长于100mm）中的深处缺陷，并将其应用于大型陶瓷样品和铝样品。为了评估使用UT阵列探头的可视化效果，尝试了一些延迟时间，降噪和图像重建方法的配置，并检查了它们的影响，以构建用于检查大型陶瓷产品的NDT系统。

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  • 会议地点 Daytona Beach FL(US);Daytona Beach FL(US);Daytona Beach FL(US)
  • 作者

    Yoshihiro Nishimura; Takayuki Suzuki; Katsumi Fukuda; Naoya Saito;

  • 作者单位

    National Institute of Advanced Industrial Science and Technology 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564, Japan;

    National Institute of Advanced Industrial Science and Technology 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564, Japan;

    Tokyo National College of Technology 1220-2, Kunugida, Hachioji, Tokyo 193-0997, Japan;

    Tokyo National College of Technology 1220-2, Kunugida, Hachioji, Tokyo 193-0997, Japan;

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