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Accurate and efficient evaluation of circuit yield and yield gradients

机译:准确有效地评估电路良率和良率梯度

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摘要

A method is described for estimating the yield and yield gradient based on a priori geometric approximation of the acceptability region in the disturbance space. Circuit performance macromodeling is used to construct the acceptability region approximation. While yield evaluation can be carried out in either the performance space or parameter space, it is shown that for monolithic integrated circuits, the gradient of yield can only be estimated accurately in the disturbance space.
机译:描述了一种用于基于扰动空间中的可接受区域的先验几何近似来估计产率和产率梯度的方法。电路性能宏模型用于构建可接受区域的近似值。虽然可以在性能空间或参数空间中进行成品率评估,但结果表明,对于单片集成电路,只能在干扰空间中准确估算成品率的梯度。

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