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Physics and engineering of atomic defects and electronic processes on laser thin film materials, based on lead chalkogenides

机译：基于铅化铅的激光薄膜材料的原子缺陷和电子过程的物理与工程

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The paper presents theoretical and experimental investigations of the influence of technological conditions of film's growing and annealing on defective subsystem and electronic processes in PbTe, PbSe and PbS films.

机译：本文介绍了薄膜生长和退火工艺条件对PbTe，PbSe和PbS薄膜中缺陷子系统和电子工艺的影响的理论和实验研究。

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《》|2003年|p.129|共1页
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Freik; D.M.; Ruvinsky; M.A.; Mezhylovska; L.Y.;
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中图分类无线电电子学、电信技术;
关键词
lead compounds; semiconductor lasers; IV-VI semiconductors; annealing; optical materials; optical films; semiconductor epitaxial layers; vacancies (crystal); atomic defects; laser thin film materials; film growth; annealing; lead chalkogenides; PbTe; PbSe; PbS;

机译：铅化合物;半导体激光器; IV-VI半导体;退火;光学材料;光学膜;半导体外延层;空位（晶体）;原子缺陷;激光薄膜材料;膜生长;退火;铅化铅; PbTe; PbSe; PbS;

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机译：0.95（Na0.5Bi0.5）TiO3-0.05BaTiO（3）无铅压电薄膜中平面缺陷的原子结构
2. Laser desorption time-of-flight mass spectrometry of atomic switch memory Ge_2Sb_2Te_5 bulk materials and its thin films [J] . Jan Hou?ka, Eladia Maria Pe?a-Méndez, Jakub Kolá?, Rapid Communications in Mass Spectrometry: RCM . 2014,第7期

机译：原子开关记忆Ge_2Sb_2Te_5块状材料及其薄膜的激光解吸飞行时间质谱
3. Defect engineering and opto electronic property modifications by 1.5Â MeV Li+ implantation on nano crystalline MgIn₂O₄ thin films [J] . A. Moses Ezhil Raja T. Somb M. Jayachandranc amp, C. Sanjeevirajad* Radiation Effects and Defects in Solids . 2010,第4期

机译：在纳米MgIn _{2 O _{4 纳米薄膜上进行1.5 MeV Li + 注入后的缺陷工程和光电子性能改性}}
4. Investigation of grain boundaries and interfaces in thin films of metal oxide electronic materials by means of HRTEM - A key link of interface engineering in electronic application [C] . C. L. Jia Proceedings of International Kunming Symposium on Microscopy July 2-5, 2000 Kunming, Yunnan Province, China . 2000

机译：用HRTEM研究金属氧化物电子材料薄膜中的晶界和界面-电子应用中界面工程的关键环节。
5. Atomic scale imaging and characterization of electronic defect states in dielectric thin film materials using dynamic tunneling force microscopy. [D] . Wang, Ruiyao. 2015

机译：使用动态隧穿力显微镜对介电薄膜材料中的电子缺陷状态进行原子尺度成像和表征。
6. Exploring Surface and Tunneling Properties of Defect-OrientedQuasi-Graphene/Poly(vinylidene fluoride) Nanocomposite Films as Flexible2D Materials for Electronic Applications [O] . Pooja Shukla, Subramani Amutha, Arijit Sen, 2019

机译：探索缺陷导向的表面和隧穿特性准石墨烯/聚偏二氟乙烯纳米复合薄膜的柔性电子应用的2D材料
7. Book Reviews - Shock Waves for Industrial Applications, Edited by L.E. Murr (Noyes Publications, 1988), approximately 528 pages ISBN: 0-8155-1170-1 - Supplementary Volume I: Encyclopedia of Materials Science and Engineering, Edited by Robert W. Cahn, (Pergamon Press and MIT Press, 1988), 653 pages ISBN: 0-262-03142-6 (v.1) (MIT Press), 0-08032521-1 (Pergamon Press) - Laser Microfabrication: Thin Film Processes and Lithography, Edited by Daniel J. Ehrlich and Jeffrey Y. Tsao, (Academie Press, 1989), 587 pages ISBN: 0-12-233430-2 [O] . 1990

机译：书评论 - 由L.E编辑的工业应用的冲击波Murr（Noyes Publications，1988），约528页ISBN：0-8155-1170-1 - 补充卷I：由Robert W. Cahn编辑的材料科学与工程百科全书（Pergamon Press和MIT Press，1988），653页面ISBN：0-262-03142-6（MIT Press），0-08032521-1（Pergamon Press） - 激光微型制作：薄膜工艺和光刻，由Daniel J. Ehrlich和Jeffrey Y. Tsao编辑，（Academie Press，1989），587页ISBN：0-12-233430-2
8. Atomic Layer Epitaxy of Group IV Materials: Surface Processes, Thin Films,Devices and Their Characterization [R] . Davis, R. F., Bedair, S., El-Masry, N. A., 1996

机译：IV族材料的原子层外延：表面处理，薄膜，器件及其表征

Physics and engineering of atomic defects and electronic processes on laser thin film materials, based on lead chalkogenides

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