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An Automated Technique to Identify Defective CMOS Devices based on Linear Regression Analysis of Transient Signal Data

机译：基于瞬态信号数据线性回归分析的缺陷器件自动识别技术

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来源
《》|2001年|P.32-36|共5页
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Plusquellic; J.F.; Chiarulli; D.M.;
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中图分类无线电电子学、电信技术;
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机译：基于瞬态信号数据线性回归分析的CmOs器件缺陷识别自动化技术

An Automated Technique to Identify Defective CMOS Devices based on Linear Regression Analysis of Transient Signal Data

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