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Single-wafer manufacturing technologies in 300-mm wafer fab

机译:300毫米晶圆厂中的单晶圆制造技术

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In this paper we describe a new technology implemented with all single-wafer processing in a 300-mm wafer fab. Fully automated manufacturing line is designed to reduce both cycle time and operators. The process has been re-integrated to eliminate all of long-time processes. New cleaning solutions reduce process time drastically and enable us to realize single-wafer wet clean process. Long rinse time is found to cause surface roughness on silicon substrate and degrade device performance. Higher reliability on gate oxide and higher performance of devices are achieved with single-wafer wet clean system. As the results, a very aggressive cycle time has been achieved with high yield and excellent reliability.
机译:在本文中,我们描述了一种用300mm晶片Fab中的所有单晶片处理实现的新技术。全自动制造生产线旨在减少周期时间和运营商。该过程已被重新集成以消除所有的长期流程。新的清洁解决方案大大降低了处理时间,使我们能够实现单晶片湿式清洁过程。发现长漂洗时间在硅衬底上引起表面粗糙度并降低装置性能。用单晶片湿式清洁系统实现了栅极氧化物栅极和更高性能的更高可靠性。结果,以高产和优异的可靠性实现了非常侵略性的循环时间。

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