• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>IEEE International Symposium on Electromagnetic Compatibility >Using a Single-Ended TRL Calibration Pattern to De-embed Coupled Transmission Lines
【24h】

Using a Single-Ended TRL Calibration Pattern to De-embed Coupled Transmission Lines

机译：使用单端TRL校准图案到DE-EMBED耦合传输线

获取原文
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Transmission line port de-embedding is critical in characterization and modeling for high-speed digital systems. De-embedding technique for single-ended transmission lines has been developed and widely used. However, few de-embedding techniques for coupled transmission lines have been reported in the literature. In this paper, a de-embedding technique for coupled transmission lines using a single-ended TRL (ThruReflect-Line) calibration pattern is proposed. It is based on directly obtaining VNA (Vector Network Analyzer) error correction data from measurement and post data processing. As accurate de-embedding is related to the equipments used in the measurement, the proposed technique is verified on two different VNAs with different architectures including a three-sampler VNA and a four-sampler VNA. Good agreement of de-embedded mixed-mode S-parameters has been achieved on both VNAs.
机译：传输线路端口去嵌入对于高速数字系统的表征和建模至关重要。开发和广泛使用用于单端传输线的去嵌入技术。然而，在文献中报道了用于耦合传输线的一些去嵌入技术。本文提出了一种使用单端TR1（ThreureFlect-Line）校准模式的用于耦合传输线的去嵌入技术。它基于直接获得VNA（矢量网络分析仪）纠错数据从测量和后数据处理。由于精确的去嵌入与测量中使用的设备有关，所提出的技术在具有不同架构的两个不同VNA上验证，包括三个采样器VNA和四个采样器VNA。在两个VNA上都已经实现了解除嵌入式混合模式S参数的良好一致性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号