首页> 外文会议>2009 European Conference on Radiation and Its Effects on Components and Systems >Total-dose effects caused by high-energy neutrons and γ-rays in Multiple-Gate FETs
【24h】

Total-dose effects caused by high-energy neutrons and γ-rays in Multiple-Gate FETs

机译:多门FET中高能中子和γ射线引起的总剂量效应

获取原文

摘要

This work investigates the effects of high-energy neutrons and γ-rays on Multiple-Gate FETs with different geometries (notably gate lengths down to 50 nm). The impact of radiation on device behavior is addressed through the variation of parameters such as threshold voltage, subthreshold slope, transconductance maximum and DIBL. It is shown that degradations caused by γ-rays and high-energy neutrons with similar doses are largely similar. It is revealed that, contrarily to the generally-believed immunity to irradiation, very short-channel FinFETs can become extremely sensitive to the total dose effect. The possible reasons are discussed.
机译:这项工作研究了高能中子和γ射线对具有不同几何形状(尤其是栅极长度低至50 nm)的多栅极FET的影响。辐射对器件行为的影响通过参数变化来解决,例如阈值电压,亚阈值斜率,最大跨导和DIBL。结果表明,由类似剂量的γ射线和高能中子引起的降解非常相似。据揭示,与通常认为的对辐射的免疫力相反,非常短通道的FinFET对总剂量效应可能变得极为敏感。讨论了可能的原因。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号