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首页> 外文会议>European Conference on Radiation and Its Effects on Components and Systems >Dynamic Heavy Ion SEE Testing of Microsemi RTG4 Flash-based FPGA Embedding a LEON4FT-based SoC
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Dynamic Heavy Ion SEE Testing of Microsemi RTG4 Flash-based FPGA Embedding a LEON4FT-based SoC

机译：动态重离子见MicroSemiTTG4基于闪存的FPGA的测试嵌入基于Leon4FT的SoC

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The Cobham Gaisler LEON4FT is a fault-tolerant synthesizable VHDL model of a 32-bit processor core, compliant with the SPARC V8 architecture. The model is highly configurable and particularly suitable for System-on-Chip (SoC) designs. The processor is the basis of the Cobham Gaisler GR740, a radiation-tolerant SoC that features a quad-core LEON4FT processor, as well as several other peripherals. The Microsemi RTG4 Field Programmable Gate Array (FPGA) is fabricated using a low-power, 65 nm CMOS Flash technology, which is known to provide higher immunity to radiation-induced errors than SRAM-based FPGAs. This work performs a dynamic test of RTG4 FPGA embedding a LEON4FT-based SoC under heavy ion-induced single event effects. The results obtained demonstrate the effectiveness of the fault-tolerant techniques adopted at both device and design levels in a real application.
机译：Cobham Gaisler Leon4ft是一个容错合成的32位处理器核心的VHDL模型，符合SPARC V8架构。该模型是高度可配置的，特别适用于片上系统（SOC）设计。处理器是COBHAM GAINLER GR740的基础，一种宽容的SOC，其具有四核Leon4FT处理器，以及其他几个外围设备。 MicroSEMITTG4场可编程门阵列（FPGA）使用低功率，65nm CMOS闪存技术制造，已知为基于SRAM的FPGA提供更高的辐射引起的误差。在重离子引起的单一事件效果下，该工作对RTG4 FPGA的动态测试嵌入基于Leon4FT的SOC。获得的结果证明了在实际应用中的设备和设计级别采用的容错技术的有效性。

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