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LINEARITY ANALYSIS IN DOUBLE GATE GRADED-CHANNEL SOI DEVICES APPLIED TO 2-MOS MOSFET-C BALANCED STRUCTURES

机译:双栅极分级通道SOI设备的线性分析应用于2-MOS MOSFET-C平衡结构

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This paper examines the linearity of 2-MOS MOSFET-C balanced structures using conventional and Graded-Channel (GC) Gate-All-Around (GAA) devices. The distortion analysis has been performed through the evaluation of third order harmonic distortion (HD3). The study has been carried out through experimental results, two-dimensional process and device simulations. Along this work, the best operation bias in terms of HD3 is determined for each analysed device and the couple device that exhibits lower HD3 is pointed out. The use of GC GAA devices in 2-MOS structures has showed to improve the linearity in relation to the conventional GAA. Finally, a discussion over the non-linearities causes is performed clarifying their origins and the improvement provided by the adoption of GC GAA devices in 2-MOS structures.
机译:本文使用常规和分级通道(GC)全方位(GAA)设备检查2-MOS MOSFET-C平衡结构的线性度。已经通过评估了第三阶谐波失真(HD3)来执行失真分析。该研究通过实验结果,二维过程和设备模拟进行了。沿着这项工作,针对每个分析的装置确定HD3的最佳操作偏差,并且指出了呈现较低HD3的耦合装置。在2-MOS结构中使用GC GaA器件已经显示出改善与传统Gaa相关的线性。最后,通过在2-MOS结构中采用GC GaA器件的采用来进行对非线性原因的讨论,阐明它们的起源和改进。

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