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Study of nano-manipulation approach based on the least action principle using AFM based robotic system

机译:基于AFM基于AFM机器人系统的基于最小动作原理的纳米操纵方法研究

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Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to the area of nano-manipulation. It can be quite valuable in the further study of maneuvering nano-particles. Because of the influence of the tip morphology on the tip pushing direction, it is difficult to establish an effective operating model for stably manipulating nanoparticles with controllable manipulation results. To resolve this problem, the acting force of manipulating the nano-particle is analyzed firstly based on the least action principle. Then the influence of the contact point between the nano-particle and the tip is taken into account on the pushing direction, and manipulation of the nano-particle is modeled to predict its position after manipulation. Next, the model parameter is calibrated through several tests. Finally, the proposed model is verified by assembling the nano-structure. The experimental results illustrate that the model can effectively predict the nano-particle position after maneuvering, and can improve the manipulation efficiency.
机译:原子力显微镜(AFM)最初用于观察样品表面,然后延伸到纳米操纵面积。在进一步研究操纵纳米粒子中,它可以是非常有价值的。由于尖端形态对尖端推动方向的影响,难以建立具有可控操作结果的稳定操纵纳米颗粒的有效操作模型。为了解决这个问题,首先基于最小动作原理来分析操纵纳米粒子的作用力。然后考虑在推进方向上考虑纳米粒子和尖端之间的接触点的影响,并建模纳米粒子的操纵以预测操作后的位置。接下来,通过多个测试校准模型参数。最后,通过组装纳米结构来验证所提出的模型。实验结果表明,该模型可以有效地预测操纵后的纳米粒子位置,并可以提高操纵效率。

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