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Design of combined microscopical and scatterometrical imaging device of surface inspection

机译:表面检验组合显微镜和散射散射成像装置的设计

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Since the primary image in microscopic devices is nothing else than the scatter image of the aperture under investigation, an imaging scatterometer could be used as a microscope as well. It is self-evident to seek a combination: in both domains only the power distribution can be obtained with low effort, so a direct conversion into each other via Fourier transform is not the way to go. On the other hand, both domains have their advantages: while the original image shows the large structures, in other words the lower frequencies, the scatter image resolves the high spatial frequencies. The current paper deals with theoretical and practical aspects of basic design concepts. A corresponding paper is dedicated to concepts of the combined data analysis.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:由于微观器件中的主图像没有馈送孔的散射图像,因此成像散射仪也可以用作显微镜。寻求组合是不言而喻的:在两个域中,只能以低成本获得功率分布,因此通过傅里叶变换彼此直接转换不是要走的方式。另一方面,两个域都具有它们的优点:虽然原始图像显示大结构,但是换句话说,散射图像解析了高空间频率。目前的论文涉及基本设计理念的理论和实践方面。相应的论文致力于组合数据分析的概念。©(2012)照片光学仪表工程师的版权协会(SPIE)。仅供个人使用的摘要下载。

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