A 0.885ppm/°C digitally calibrated bandgap voltage reference with robust start-up circuit

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• 来源
  《IEEE International Conference on Solid-State and Integrated Circuit Technology》|2014年|1-3|共3页
• 会议地点
• 作者

  Ji He; Long Zhao; Yuhua Cheng;

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• 会议组织
• 原文格式 PDF
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• 关键词

  CMOS integrated circuits; calibration; digital control; reference circuits; TC BGR; digitally calibrated bandgap voltage reference; digitally-controlled calibration scheme; low-voltage low temperature coefficient; power 303 muW; robust start-up circuit; size 0.18 mum; standard CMOS process; voltage 1.8 V; voltage 604 mV; Abstracts; BiCMOS integrated circuits; CMOS integrated circuits; CMOS technology; Photonic band gap; Robustness;

  机译：CMOS集成电路;校准;数字控制;参考电路; TC BGR;数字校准带隙电压参考;数字控制校准方案;低压低温系数;功率303μW;稳健的启动电路;尺寸0.18微米;标准CMOS工艺;电压1.8 V;电压604 mV;摘要; BiCMOS集成电路; CMOS集成电路; CMOS技术;光子带隙;鲁棒性;