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A new photomask pattern generation method based on i-line stepper

机译:一种基于I线步进器的新型光掩模模式生成方法

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New pattern generation system, Photomask Repeater, based on i-line stepper has been developed. This system can transfer device patterns from master masks onto a photomask plate with 22mm field size. To print a chip larger than the 22mm field, stitching technology has been developed. Critical dimension error in the region where fields are stitched is the key issue of this technology. Quantification of critical dimension deviation induced by field msiplacement was carried out by calculation. Introducing exposure dose gradation, it was reduced less than 1.5nm. From measurements of a real exposed mask this technique proved to be able to stitch fields seamlessly. Major two specifications, pattern placement accuracy and critical dimension uniformity, were evaluated. Both specifications required for 150nm photomasks were fully satisfied. Availability of the photomask repeater to memory device and system on chip is discussed.
机译:基于I-Line步进器的新图案生成系统,Photomask Repeater已经开发出来。该系统可以将从主掩模的装置图案传送到具有22mm的光掩模板上。要打印大于22mm场的芯片,已经开发了拼接技术。缝合字段拼写的区域中的关键尺寸错误是该技术的关键问题。通过计算进行了现场Msipacement诱导的临界尺寸偏差的量化。引入曝光剂量级别,降低小于1.5nm。根据真正暴露的掩模的测量,该技术证明能够无缝缝合场。评估主要的两个规格,图案放置精度和临界尺寸均匀性。 150nm光掩模所需的两种规格都完全满足。讨论了Photomask中继器到存储器设备和芯片系统上的可用性。

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