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GeSn waveguide photodetectors fabricated by rapid-melt-growth method

机译:快速熔融生长法制备的GeSn波导光电探测器

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摘要

A GeSn metal-semiconductor-metal (MSM) photodetector is fabricated on a silicon-on-insulator (SOI) waveguide by rapid melt growth method. The Sn concentration of the GeSn photodetector is 2 % and shows a larger photo-responsivity by comparing with a pure Ge photodetector at long wavelength. The dark current is 3.7e-7 A at 5.4 V and the operation speed can be as high as 6.2 GHz.
机译:通过快速熔体生长方法在绝缘体上硅(SOI)波导上制造了GeSn金属-半导体-金属(MSM)光电探测器。 GeSn光电探测器的Sn浓度为2%,与长波长的纯Ge光电探测器相比,具有更高的光响应性。 5.4 V时的暗电流为3.7e-7 A,工作速度可高达6.2 GHz。

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