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Improvement of Vertical Diode Properties by N-type Plasma Doping for Low-Power Phase Change Non-Volatile Memory (NVM)

机译:N型等离子体掺杂的垂直二极管特性改善低功率相位变化非易失性存储器(NVM)

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Using PH_(3) N-type plasma doing (PLAD), the device characteristics of high performance vertical switch diode for 50nm phase-change NVM have been studied. Compared to the conventional beam line ion implantation, there are improvements of diode breakdown voltage (B.V.) and isolation B.V., respectively 20percent and 41percent by N-type PLAD doping due to the higher doping level and shallower profile in N+ region. It also shows excellent off-leakage properties less than 10pA/cell without decreasing the Ion. From the results of this study, N-type PLAD has been demonstrated to be effective for vertical diode electrical properties as well as for high productivity.
机译:使用PH_(3)N型等离子体进行(PLAD),研究了50nm相变NVM的高性能垂直开关二极管的器件特性。与传统的光束线离子注入相比,由于较高的掺杂水平和较浅的曲线在N +区域中,分别由二极管击穿电压(B.V.)和隔离B.V的分离和41分别进行了改善。它还显示出优异的漏泄漏性能小于10pa /电池而不降低离子。从本研究的结果,已经证明了N型PLAD为垂直二极管电性能以及高生产率有效。

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