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首页> 外文会议>International Conference on Lightning Protection >Investigation of the effects of multi-waveform multi-pulse impulse currents on MOV for class I SPD through operating duty tests
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Investigation of the effects of multi-waveform multi-pulse impulse currents on MOV for class I SPD through operating duty tests

机译：多波形多脉冲电流对IS SPD级MOV的影响研究

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In order to evaluate the performance of class I SPDs under more close to practical operating situation, operating duty tests (ODT) with multi-waveform multi-pulse impulse currents are carried out on MOVs for class I SPDs. The multi-waveform multi-pulse currents consist of quadruple impulse currents with one 10/350 μs impulse simulating first return stroke current, one 2 ms rectangular impulse simulating long duration current between return strokes, and two steep impulses simulating subsequent return stroke currents. The test results show that all the MOV samples could pass the standard ODT according to IEC61643-11 without degradation, while the electrical and physical properties of MOVs under multi-waveform multi-pulse operating duty tests (MODT) would significantly deteriorate. The MOVs with high limiting voltage have better withstand capability under MODT. The main failure modes for MOVs after MODT include the crack on the plastic encapsulation, the punctures close to the edge of varistors, and shattering of the varistor. Some interesting phenomena are also observed, such as, the MOVs would be more easily damaged if the first return stroke is directly followed by subsequent return stroke without interval current, the tested MOVs that could pass the MODT under time interval of 100 ms between the multiple currents all failed in the tests under time interval of 20 ms. The microstructural examination indicates that after the MODT, the grain size of the punctured ZnO materials would become smaller and the quantity of the white intergranular phase between grains significantly increases.
机译：为了在更接近的实际操作情况下评估I类SPD的性能，在I类SPD的MOV上执行具有多波形多脉冲脉冲电流的操作占空比测试（ODT）。多波形多脉冲电流包括四倍脉冲电流，其中一个10/350μs脉冲模拟第一返回行程电流，模拟返回行程之间的长持续时间电流的一个2ms矩形脉冲，以及模拟后续返回行程电流的两个陡峭冲动。测试结果表明，所有MOV样本都可以根据IEC61643-11通过无退化的标准ODT，而在多波形多脉冲操作占空比（MODT）下的MOV的电气和物理性质将显着恶化。具有高限制电压的MOV在MODT下具有更好的耐受能力。 MODT后的MOV的主要故障模式包括塑料封装上的裂缝，靠近压敏电阻边缘的穿刺，以及压力变压器。还观察到一些有趣的现象，例如，如果直接返回行程直接返回行程，则会更容易地损坏MOV，而在没有间隔电流的情况下，可以将MODT在多个倍之间的时间间隔下的测试移动到多个返回行程在20毫秒的时间间隔下的测试中所有失败的电流。微观结构检查表明，在MODT之后，刺破的ZnO材料的粒度将变小，并且晶粒之间的白色晶间相的数量显着增加。

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