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Rapid SOC prototyping utilizing quilt packaging technology for modular functional IC partitioning

机译:利用被子封装技术进行快速SOC原型设计,以进行模块化功能IC划分

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A microchip integration technology called Quilt Packaging (QP) enables rapid prototyping of complex SoCs and microwave/RF systems, as well as optical, power, and DSP applications. QP is a direct edge-to-edge chip-level interconnect technology that can be implemented in a variety of materials and/or process technologies, and has been demonstrated in both planar and non-planar 3D architectures. Quilt Packaging technology can be applied to create a “Lego-like” design kit for ultra-fast prototyping and proof-ofconcept chip-level system verification. Partitioning subcomponents into small, inexpensive “chiplets” can allow for much faster design turns and greatly reduced first-pass prototype verification. In addition, QP enables low-loss, high-throughput chip-to-chip I/O interconnects while reducing size, weight, and power requirements, lessening the burden of design trade-offs for hardware system designers developing the next generation of microelectronic systems.
机译:一种称为Quilt Packaging(QP)的微芯片集成技术可对复杂的SoC和微波/ RF系统以及光学,电源和DSP应用进行快速原型设计。 QP是一种直接的边到边芯片级互连技术,可以用多种材料和/或工艺技术来实现,并且已经在平面和非平面3D架构中得到了证明。可以使用被子包装技术来创建“类似乐高”的设计套件,以进行超快速原型设计和概念验证的芯片级系统验证。将子组件划分为小型,廉价的“小芯片”可以大大加快设计周期,并大大减少首过原型验证。此外,QP支持低损耗,高吞吐量的芯片到芯片I / O互连,同时减小尺寸,重量和功耗要求,从而减轻了开发下一代微电子系统的硬件系统设计人员的设计折衷负担。 。

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