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THz metrology for active electronic devices: state of the art and challenges

机译：有源电子设备的THz计量：最新技术和挑战

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摘要

The area of terahertz science and applications has grown dramatically in the last 30 years. Instrumental platforms for THz measurements have also proliferated, and now include laser-based, electronic, opto-electronic, and microwave photonics devices. As the field matured, metrology and standardization have gained focused attention, resulting in an increasing number of publications and a book devoted to the subject. However, these have been primarily focused on photonic-based free-space techniques and their particular demands and issues. This paper presents a brief review of metrology requirements for active THz electronic devices, the available instrumentation, state of the art, and challenges.
机译：在过去的30年中，太赫兹科学和应用领域急剧增长。用于太赫兹测量的仪器平台也已经激增，现在包括基于激光的，电子的，光电的和微波光子学设备。随着该领域的成熟，计量学和标准化已经引起了人们的关注，导致出版了更多有关该主题的出版物和一本书。但是，这些技术主要集中在基于光子的自由空间技术及其特殊要求和问题上。本文简要介绍了有源THz电子设备的计量要求，可用的仪器，最新技术和挑战。

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