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首页> 外文会议>International conference on sensing and imaging >Microwave and Millimeter Wave Sensors for Nondestructive Testing and Evaluation
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Microwave and Millimeter Wave Sensors for Nondestructive Testing and Evaluation

机译：用于非破坏性测试和评估的微波和毫米波传感器

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Microwave nondestructive testing and the sensors required to affect the testing are less well known than other electromagnetic methods such as eddy currents techniques. Nevertheless, they occupy a critical role in testing as well as imaging of conditions and flaws in primarily nonmetallic structures including plastics, polymers, and ceramics as well as wood structures, various composites and concrete. It has also found uses in conductors for surface testing and for evaluations of coatings. The methods and sensors range from microscopy to industrial scale testing and from simple open-ended waveguides to complex radars. The frequency range covers the whole microwave range and down to mm waves. The present work discusses the use of microwave testing, its place in a nondestructive testing regime, and a sampling of sensors that are representative of the art and its present state, with emphasis on emerging methods.
机译：微波无损检测和影响测试所需的传感器不如其他电磁方法所知，如涡流技术。尽管如此，它们在测试中占据了关键作用以及主要的非金属结构的条件和缺陷的成像，包括塑料，聚合物和陶瓷以及木结构，各种复合材料和混凝土。它还发现了导体用于表面测试和对涂层的评估。方法和传感器的范围从显微镜到工业规模测试，并从简单的开放式波导到复杂的雷达。频率范围涵盖整个微波范围，然后覆盖到MM波。本工作讨论了微波检测的使用，其在非破坏性测试制度中的位置，以及代表本领域的传感器的采样及其现状，重点是新兴方法。

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