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Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT)

机译:利用频率响应分析(FRA)和高加速寿命测试(HALT)研究IGBT栅极驱动器的振动电阻

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This work presents a methodology to determine the vibrational resistance of electrical components in power electronic systems. The procedure is exemplified by an IGBT gate driver that is mechano-dynamically characterized applying Laser- Doppler-Vibrometry. The experimental reference is used to validate a finite element model for predicting frequency response functions. Knowing the stress configuration of the gate driver for different automotive design spaces, statistical measures are applied to assess high cycle fatigue. Based on the thesis of linear damage calculation, critical devices are identified and time to failures calculated. As predicted lifetimes significantly exceed reasonable laboratory times, a modified HALT test is introduced that validates the lifetime model.
机译:这项工作提出了一种确定电力电子系统中电气组件的振动阻力的方法。该过程以IGBT栅极驱动器为例,该驱动器采用激光多普勒振动法进行了机械动力学表征。实验参考用于验证预测频率响应函数的有限元模型。了解了不同汽车设计空间的栅极驱动器的应力配置后,可以采用统计方法来评估高周疲劳。根据线性损伤计算的主题,确定关键设备并计算出故障时间。由于预测的寿命大大超过合理的实验室时间,因此引入了改进的HALT测试来验证寿命模型。

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