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首页> 外文期刊>IEEE Transactions on Components, Hybrids, and Manufacturing Technology >Highly accelerated life testing (HALT) for multilayer ceramic capacitor qualification
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Highly accelerated life testing (HALT) for multilayer ceramic capacitor qualification

机译：高度加速寿命测试（HALT），用于多层陶瓷电容器鉴定

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摘要

A highly accelerated life-test (HALT) method was employed to life test nearly 20 vendor lots of 50-V rated COG, X7R, and Z5U chip capacitors at 400 V and 140 degrees C stress. Their failure rates were compared with those observed in the standard 1000-h life test at 100 V and 125 degrees C stress. Acceptable correlation was observed between the two methods. In addition to reducing the qualification time from months to a few days, HALT has the capability of ascribing the device failures to manufacturing-process or material defects. It can greatly help users to identify defective lots quickly, determine the mean-time-to-failure of each incoming, lot, and detect major changes in the vendor's processes.
机译：采用了高度加速的寿命测试（HALT）方法在400 V和140摄氏度的应力下对将近20个供应商的50 V额定COG，X7R和Z5U贴片电容器进行了寿命测试。将它们的故障率与在100 V和125℃应力下的标准1000小时寿命测试中观察到的故障率进行了比较。在两种方法之间观察到可接受的相关性。除了将认证时间从几个月缩短到几天之外，HALT还具有将设备故障归因于制造过程或材料缺陷的能力。它可以极大地帮助用户快速识别有缺陷的批次，确定每批进货批次的平均故障时间，并检测供应商流程中的重大变化。

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