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Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)

机译:X7R多层陶瓷电容器在高加速寿命测试(HALT)期间的可靠性

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摘要

Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 °C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (Ea) and a voltage stress exponent (n), in order to predict their time to failure. The values of Ea are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO3-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the Ea can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V.
机译:多层陶瓷电容器(MLCC)是根据故障时间确定电子组件可靠性的必要组件。众所周知,MLCC的可靠性取决于其成分,加工和操作条件。在本工作中,我们通过在400 V和600 V高达200°C的温度下进行高加速寿命测试(HALT),分析了三种类似的基于BaTiO3的X7R型MLCC的寿命。将结果调整为Arrhenius方程,它是活化能(Ea)和电压应力指数(n)的函数,以便预测其失效时间。 Ea的值在1-1.45 eV的范围内,据报道这是基于BaTiO3的介电电容器的热失效和介电损耗的结果。应力电压指数值在4-5之间。尽管Ea可能与故障机制有关,但n仅表示测试中电压的影响。可以将这些值与每种类型的MLCC进行关联,以便可以在400–600 V的范围内估计其预期寿命。

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