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Signal processing hardware and software applied to the development of a real-time infrared mission simulation test capability

机译：信号处理软硬件应用于开发实时红外任务模拟测试功能

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Abstract: The Arnold Engineering Development Center (AEDC) SceneGeneration Test Capability (SGTC) program has completedthe development of a laser based Direct Write SceneGeneration (DWSG) facility that provides dynamicmission simulation testing for infrared (IR) FocalPlane Array (FPAs) and their associated signalprocessing electronics. The AEDC DWSG Focal Plane ArrayTest Capability includes lasers operating at 0.514,1.06, 5.4, or 10.6 $mu@m, and Acousto-Optic Deflectors(AODs) which modulate the laser beam position andamplitude. Complex Radio Frequency (RF) electronicscontrol each AOD by providing multi-frequency inputs.These inputs produce a highly accurate and independentmulti-beam deflection, or `rake', that is swept acrossthe FPA sensor under test. Each RF amplitude input toan AOD translates into an accurate and independent beamintensity in the rake. Issues such as scene fidelity,sensor frame rates, scenario length, and real-timelaser beam position adjustments require RF controlelectronics that employ the use of advanced analog anddigital signal processing techniques and designs. Byimplementing flexible system architectures in theelectronics, the overall capability of the DWSG toadapt to emerging test requirements is greatlyenhanced. Presented in this paper is an overview of thesignal processing methodology and designs required tohandle the DWSG requirement. Further, electronic designtechniques that enabled the system to be implementedwithin program cost constraints will also be presented.These electronic designs include a broad range ofdisciplines including digital signal processinghardware and software, programmable logicimplementations, and advanced techniques for highfidelity RF synthesis, switching, and amplitudecontrol. Techniques for validating electronicperformance will also be presented along with dataacquired using those techniques.!1
机译：摘要：阿诺德工程开发中心（AEDC）场景生成测试功能（SGTC）程序已完成基于激光的直接写场景生成（DWSG）设施的开发，该设施可为红外（IR）焦平面阵列（FPA）及其相关信号处理提供动态发射模拟测试电子产品。 AEDC DWSG焦平面阵列测试功能包括工作在0.514、1.06、5.4或10.6μμm的激光器，以及可调节激光束位置和振幅的声光偏转器（AOD）。复杂的射频（RF）电子设备通过提供多频输入来控制每个AOD，这些输入产生高度准确且独立的多光束偏转或``耙''，并扫过被测FPA传感器。输入到AOD的每个RF幅度都会转换成耙中的准确且独立的波束强度。诸如场景保真度，传感器帧速率，场景长度和实时激光束位置调整之类的问题，需要使用先进的模拟和数字信号处理技术和设计的RF控制电子设备来解决。通过在电子产品中实现灵活的系统架构，DWSG能够适应新兴的测试要求的整体功能得到了极大的增强。本文介绍了信号处理方法和处理DWSG要求所需的设计的概述。此外，还将介绍使系统能够在程序成本限制内实现的电子设计技术。这些电子设计包括广泛的学科，包括数字信号处理硬件和软件，可编程逻辑实现以及用于高保真度RF合成，切换和幅度控制的先进技术。还将提供验证电子性能的技术以及使用这些技术获得的数据。！1

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