首页> 外文会议>Electron Devices Meeting, 1999. IEDM Technical Digest. International >Integration and design issues in combining very-high-speed silicon-germanium bipolar transistors and ULSI CMOS for system-on-a-chip applications
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Integration and design issues in combining very-high-speed silicon-germanium bipolar transistors and ULSI CMOS for system-on-a-chip applications

机译:结合超高速硅锗双极晶体管和ULSI CMOS用于片上系统应用的集成和设计问题

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In the last decade, silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) BICMOS technology has developed from being a lab curiosity to becoming a production manufacturing technology that replaces and extends the performance of silicon-based BICMOS technology. The impetus for this development has been the insatiable requirement for bandwidth in network communication at speeds up to 40 Gbit/s and the rapid growth of the global cellular and wireless LAN markets. To meet the stringent criteria of many of these communications protocols, SiGe technology offers a cost-effective system-level solution compared to gallium-arsenide and other approaches. This paper will focus on integration, manufacturing and design issues in SiGe BICMOS circuits and systems, based on 15 years of work in our labs and fabs, and 4 generations of scaling CMOS-compatible SiGe, with concrete examples.
机译:在过去的十年中,硅锗(SiGe)异质结双极晶体管(HBT)BICMOS技术已经从实验室的好奇心发展到了替代和扩展基于硅的BICMOS技术的性能的生产制造技术。这种发展的动力是对网络通信中对带宽的不满足要求,速度高达40 Gbit / s,并且全球蜂窝和无线LAN市场迅速增长。为了满足许多此类通信协议的严格标准,与砷化镓和其他方法相比,SiGe技术提供了一种经济高效的系统级解决方案。本文将基于我们实验室和晶圆厂15年的工作经验以及4代可缩放CMOS兼容SiGe的工作,重点关注SiGe BICMOS电路和系统的集成,制造和设计问题,并提供具体示例。

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