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THE SENSITIVITY OF WO_3 THIN FILMS TO O_3, NO_2 AND Cl_2 GASES

机译:WO_3薄膜对O_3,NO_2和Cl_2气体的敏感性

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WO_3 thin films have been prepared by Sol-Gel (SG), Radio Frequency Sputtering (RFS) and Vacuum Thermal Evaporation (VTE) techniques on alumina substrates and annealed at 600°C for 24 h in air. The morphology, crystalline phase and chemical composition have been characterized using SEM, XRD and XPS techniques. The electrical response has been measured by exposing the films to O_3 (10 to 180 ppb), NO_2 (0.2 to 1 ppm) and Cl_2 (0.1 to 1 ppm) and operating temperatures between 150°C and 450°C and 50% humid air. The response to O_3 has been found to be at maximum at 400°C. At this temperature that of NO_2 and Cl_2 is negligible. Improvements on the O_3 gas sensitivity and selectivity can be achieved by fixing the operating temperature at 400°C. The most recommended temperature for NO_2 and Cl_2 detection has resulted to be 200°C.
机译:WO_3薄膜已通过Sol-Gel(SG),射频溅射(RFS)和真空热蒸发(VTE)技术在氧化铝基板上制备,并在空气中于600°C退火24小时。形态,结晶相和化学组成已使用SEM,XRD和XPS技术进行了表征。通过将薄膜暴露于O_3(10至180 ppb),NO_2(0.2至1 ppm)和Cl_2(0.1至1 ppm)以及在150°C至450°C的工作温度和50%湿空气中的温度下进行测量。发现对O_3的响应在400°C时最大。在此温度下,NO_2和Cl_2的含量可以忽略不计。通过将工作温度固定在400°C,可以提高O_3气体的灵敏度和选择性。用于NO_2和Cl_2检测的最推荐温度为200°C。

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