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首页> 外文会议>Electromagnetic Compatibility, 2002 3rd International Symposium on >Study on ESD characteristics and its effect mechanism
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Study on ESD characteristics and its effect mechanism

机译：ESD特性及其影响机理研究

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Based on experimental study on microcircuit and electric explosive device (EED) applied by electrostatic discharge (ESD), the characteristics and its electric conduction law of ESD are introduced. And it is shown that the generally accepted Ohm's law is not followed at times under very high electrostatic field. In another words, ESD discharge curve is not an exponential decay one. ESD may form a hazard to microcircuit and EED. And its effect mechanism includes thermal effect of adiabatic process, electromagnetic interference from broadband electromagnetic radiation, overstress in high potential electrostatic field and field-caused breakdown effect etc. The failure rate may reach about 50% for unprotected MOS circuits and 10% for bipolar circuits due to general ESD hazards. The electrostatic ignition energy of EED is smaller with 2-3th power than that of the EED which is ignited through electrifying.
机译：在对静电放电（ESD）应用于微电路和电爆炸装置（EED）的实验研究的基础上，介绍了ESD的特性及其导电规律。结果表明，在非常高的静电场下，有时不会遵循公认的欧姆定律。换句话说，ESD放电曲线不是指数衰减曲线。 ESD可能会对微电路和EED造成危害。其影响机理包括绝热过程的热效应，宽带电磁辐射产生的电磁干扰，高电位静电场中的过应力和场致击穿效应等。无保护的MOS电路的故障率可能达到50％左右，双极电路的故障率可能达到10％由于一般的ESD危害。 EED的静电点火能量小于2-3，而EED的静电点火能量是通过带电点火的。

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