Studies on oscillator strength of nanostructured amorphous, anatase and rutile TiO2 films

机译：纳米非晶，锐钛矿和金红石型TiO 2 薄膜的振子强度研究

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Nanocrystalline thin films of amorphous, anatase and rutile titanium dioxide are prepared using pulsed laser deposition technique. The refractive indices of these films are determined from the optical transmittance spectra using Swanepol method. The optical band gap, optical conductivity, complex dielectric constant and dissipation factor of the films grown under different conditions are calculated. The oscillator strength of these films, calculated using Wemple and Didomenico model, is found to be sensitive not only to the phase, but also to the oxidation kinetics under which the films are formed.

机译：使用脉冲激光沉积技术制备了非晶态，锐钛矿型和金红石型二氧化钛的纳米晶体薄膜。这些薄膜的折射率是使用Swanepol方法根据光透射光谱确定的。计算了在不同条件下生长的薄膜的光学带隙，光学导率，复介电常数和耗散因子。发现使用Wemple和Didomenico模型计算的这些膜的振子强度不仅对相位敏感，而且对形成膜的氧化动力学敏感。

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《2011 3rd International Congress on Ultra Modern Telecommunications and Control Systems and Workshops》|2011年|p.1-10|共10页
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Sankar S.; Gopchandran K. G.;
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中图分类通信;
关键词
Dielectric constant; Optical dispersion parameters; Oscillator strength;

机译：介电常数光学色散参数振荡器强度;

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4. Studies on oscillator strength of nanostructured amorphous, anatase and rutile TiO2 films [C] . Sankar S., Gopchandran K. G. International Congress on Ultra Modern Telecommunications and Control Systems and Workshops . 2011

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机译：含锐钛矿和金红石的TiO2薄膜的介电和红外特性

Studies on oscillator strength of nanostructured amorphous, anatase and rutile TiO2 films

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