Cadmium sulfide thin films were grown by the successive ionic layer adsorption and reaction (SILAR) method on glass substrates using 0.2 M CdCl2 and 0.1 M Na2S precursor solutions. The immersion time was 20s and the rinsing time was 40s. X-ray diffractometry was used to determine grain sizes and the crystalline structure of the thin films. The morphological characterization was carried out using scanning electron microscopy (SEM) and transmission electron microscopy (TEM) methods. Energy dispersive X-ray (EDX) spectroscopy coupled to SEM and TEM were used for identifying the elements and determining the composition of the films. Optical properties were studied by spectrophotometric measurements. The results indicate that the CdS film deposited has a hexagonal structure, stoichiometric composition and high transmittance in the visible region.
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机译：使用0.2 M CdCl 2 和0.1 M Na 2 S前驱体溶液，通过连续离子层吸附和反应（SILAR）方法在玻璃基板上生长硫化镉薄膜。浸入时间为20s，漂洗时间为40s。 X射线衍射法用于确定晶粒尺寸和薄膜的晶体结构。使用扫描电子显微镜（SEM）和透射电子显微镜（TEM）方法进行形态表征。结合SEM和TEM的能量色散X射线（EDX）光谱用于鉴定元素并确定薄膜的成分。通过分光光度法测量光学性质。结果表明，所沉积的CdS膜在可见光区域具有六边形结构，化学计量组成和高透射率。
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