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Open-Waveguide dielectric measurements using complementary frequency selective surfaces (CFSS)

机译：使用互补频率选择表面（CFSS）的开放式波导电介质测量

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For the accurate characterization of the dielectric properties of substrates used in electromagnetic (EM) applications, robust techniques have been developed including plane-wave illumination, waveguides and resonators to meet this requirement. In previous work, the authors introduced a Waveguide-Resonator method; the resonator is the CFSS - complementary frequency selective surfaces, for dielectric constant measurements (C.C. Njoku et al., Proc. EuCAP, 2420–2422, 2013). Examining the resonant frequency, quality (Q) factor and insertion loss differences of the CFSS with and without the material under test (MUT), the permittivity and loss tangent of the MUT can be calculated. This method required the MUT cut to the WG aperture size and placed next to the CFSS within the WG in a closed environment. This paper examines the use of an open WG with one end covered by the CFSS and the sample placed over the WG flange to fully cover the aperture. Whilst the Q is low, this technique is versatile and low cost.
机译：在电磁（EM）应用中使用的底物的介电特性的精确表征，鲁棒技术已被开发，包括平面波照射，波导和谐振器来满足此要求。在以往的工作中，作者介绍了波导谐振器的方法;所述谐振器是CFSS - 互补频率选择表面，对于介电常数的测量（C.C. Njoku等人，Proc EuCAP，2420年至2422年，2013。）。检查有和没有材料CFSS的被测（MUT）的共振频率，品质（Q）因数和插入损耗的差异，MUT的介电常数和损耗角正切可以计算出来。这种方法所需的MUT切到WG孔径大小和在封闭的环境下放置在CFSS的WG内。本文探讨，其一端由CFSS覆盖并放置在WG凸缘完全覆盖孔的样品使用开放WG的。虽然Q值低，这种技术是通用的，成本低。

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