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首页> 外文会议>IEEE Energy Conversion Congress and Exposition >A GaN-Based Active Power Decoupling Approach for Enhancing the Efficiency and Reliability of Residential PV Microinverters
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A GaN-Based Active Power Decoupling Approach for Enhancing the Efficiency and Reliability of Residential PV Microinverters

机译：一种基于GaN的有源功率解耦方法，用于提高住宅光伏微逆变器的效率和可靠性

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摘要

It is a common sense that, the reliability of a system is dictated by the life-time of its weakest component. In terms of a single-phase solar photovoltaic (PV) system, including PV panel and the microinverter, the reliability of the system is confined by the electrolytic dc-link capacitor at the input of its microinverter. To enhance the reliability of the system by providing the possibility of employing film capacitors, with higher life-time rather than their electrolytic counterparts, this paper presents a novel modeling, design, and control of a PV-side active power decoupling (APD) approach. Besides, GaN FETs are employed to achieve a superior efficiency and power density of the APD. The proposed methodology is verified through a thorough design, loss modeling, and numerical analysis.
机译：这是一种常识，系统的可靠性被其最弱部件的寿命决定。就单相太阳能光伏（PV）系统而言，包括PV面板和微逆变器，系统的可靠性由电解DC-Link电容器在其微逆变器的输入中限制。为了通过提供采用薄膜电容器的可能性来提高系统的可靠性，具有更高的寿命而不是其电解对应物，提出了一种新颖的模型，设计和控制PV侧有源去耦（APD）方法。此外，采用GaN FET来实现APD的卓越效率和功率密度。通过彻底的设计，损失建模和数值分析验证所提出的方法。

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