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A mathematical model for estimating acceptable ratio of test patterns

机译:用于估计测试模式可接受比率的数学模型

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Sequential circuit testing has been recognized as one of the most difficult problems in the area of fault detection. Controllability and observability of a sequential circuit is low because of their internal states. Therefore finding suitable sequence of test patterns is becoming increasingly complex. We have proposed a method to estimate an expectation graph by utilizing a mathematical model which exploits probabilistic 4-value system. The expectation graph is used to determine the minimum number of faults detected by a suitable sequence of test patterns. Experimental results show our mathematical model has reduced number of test patterns in specified fault coverage.
机译:顺序电路测试已被认为是故障检测领域中最困难的问题之一。由于其内部状态,时序电路的可控制性和可观察性较低。因此,找到合适的测试模式序列变得越来越复杂。我们提出了一种利用利用概率四值系统的数学模型来估计期望图的方法。期望图用于确定通过适当的测试模式序列检测到的最小故障数。实验结果表明,我们的数学模型在指定的故障范围内减少了测试模式的数量。

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